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# Records Fall for 3D Chip Tech

**[IEEE Spectrum](https://daily.dev/sources/ieeespectrum)** · 6 min read · 0 upvotes · 0 comments

## Summary

Two research teams set new records in hybrid bonding, a 3D chip stacking technology, at the IEEE ECTC conference. Imec and EV Group achieved a wafer-to-wafer (W2W) bond pitch of 200 nm, down from 250 nm, while CEA-Leti reached a die-to-wafer (D2W) pitch of 1 μm — a 50% reduction from the previous 2 μm record, enabling one million connections per square millimeter. W2W improvements relied on better chemical mechanical polishing and alignment, while D2W progress centered on alignment precision. Separately, Huawei announced a 1.5 μm D2W pitch in its upcoming Kirin processors, a notable step given U.S. export control restrictions. Mass production pitches remain far behind research milestones, and improving yield at finer pitches is the next challenge.

## Full article

daily.dev links to this article rather than hosting it. Read it at the original source: <https://spectrum.ieee.org/hybrid-bonding-2677022836>

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